Avino-Salvado, O.: search on Z-Library

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1

[IEEE 2019 IEEE Applied Power Electronics Conference and Exposition (APEC) - Anaheim, CA, USA (2019.3.17-2019.3.21)] 2019 IEEE Applied Power Electronics Conference and Exposition (APEC) - Design of a Low-Capacitance Planar Transformer for a 4 kW/500 kHz DAB Converter

Demumieux, Pierre, Avino-Salvado, Oriol, Buttay, Cyril, Martin, Christian, Sixdenier, Fabien, Joubert, Charles, Ngoua Teu Magambo, Jean Sylvio, Loher, Thomas

Year:

2019

Language:

english

File:

PDF, 32 KB

english, 2019

2

Extraction of the 4H-SiC/SiO 2 Barrier Height Over Temperature

Avino-Salvado, O., Asllani, B., Buttay, C., Raynaud, C., Morel, H.

Journal:

IEEE Transactions on Electron Devices

Year:

2020

Language:

english

File:

PDF, 844 KB

english, 2020

3

Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling

Sabbah, Wissam, Arabi, Faical, Avino-Salvado, Oriol, Buttay, Cyril, Théolier, Loïc, Morel, Hervé

Journal:

Microelectronics Reliability

Year:

2017

Language:

english

File:

PDF, 1.76 MB

english, 2017

4

Simplified Mathematical Model for Calculating the Oxygen Excess Ratio of a PEM Fuel Cell System in Real-Time Applications

Restrepo, Carlos, Konjedic, Tine, Guarnizo, Cristian, Avino-Salvado, Oriol, Calvente, Javier, Romero, Alfonso, Giral, Roberto

Journal:

IEEE Transactions on Industrial Electronics

Year:

2014

Language:

english

File:

PDF, 1.71 MB

english, 2014

5

Extraction of the 4H-SiC/SiO 2 Barrier Height Over Temperature

Avino-Salvado, O., Asllani, B., Buttay, C., Raynaud, C., Morel, H.

Journal:

IEEE Transactions on Electron Devices

Year:

2020

File:

PDF, 844 KB

2020

6

SiC MOSFETs robustness for diode-less applications

Avino-Salvado, O., Cheng, C., Buttay, C., Morel, H., Labrousse, D., Lefebvre, S., Ali, M.

Journal:

Year:

2018

Language:

english

File:

PDF, 1.71 MB

english, 2018

7

High temperature ageing of microelectronics assemblies with SAC solder joints

Sabbah, Wissam, Bondue, Pierre, Avino-Salvado, Oriol, Buttay, Cyril, Frémont, Hélène, Guédon-Gracia, Alexandrine, Morel, Hervé

Journal:

Microelectronics Reliability

Year:

2017

Language:

english

File:

PDF, 1.49 MB

english, 2017

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